发明名称 Vertical trench IGBT and method for manufacturing the same
摘要 A method for manufacturing a vertical trench IGBT includes: forming a body layer of a second conductivity type on a semiconductor substrate of a first conductivity type; forming a trench passing through the body layer; forming a trench gate in the trench via a gate insulating film; forming a polysilicon film containing an impurity of a first conductivity type on the body layer; diffusing the impurity from the polysilicon film into the body layer to form an emitter layer of a first conductivity type on the body layer; and forming a collector layer of a second conductivity type on a lower surface of the semiconductor substrate.
申请公布号 US8841175(B2) 申请公布日期 2014.09.23
申请号 US201213619395 申请日期 2012.09.14
申请人 Mitsubishi Electric Corporation 发明人 Fujii Hidenori
分类号 H01L21/332 主分类号 H01L21/332
代理机构 Studebaker & Brackett PC 代理人 Studebaker & Brackett PC
主权项 1. A method for manufacturing a vertical trench IGBT comprising: forming a body layer of a second conductivity type on a semiconductor substrate of a first conductivity type; forming a trench passing through the body layer; forming a trench gate in the trench via a gate insulating film; forming a substantially planar polysilicon film containing an impurity of a first conductivity type on the body layer; diffusing the impurity from the polysilicon film into the body layer to form an emitter layer of a first conductivity type on the body layer; and forming a collector layer of a second conductivity type on a lower surface of the semiconductor substrate, wherein the emitter layer includes a true emitter layer formed in the vicinity of the trench gate, and an exterior emitter layer for extruding the true emitter layer.
地址 Tokyo JP