发明名称 |
Vertical trench IGBT and method for manufacturing the same |
摘要 |
A method for manufacturing a vertical trench IGBT includes: forming a body layer of a second conductivity type on a semiconductor substrate of a first conductivity type; forming a trench passing through the body layer; forming a trench gate in the trench via a gate insulating film; forming a polysilicon film containing an impurity of a first conductivity type on the body layer; diffusing the impurity from the polysilicon film into the body layer to form an emitter layer of a first conductivity type on the body layer; and forming a collector layer of a second conductivity type on a lower surface of the semiconductor substrate. |
申请公布号 |
US8841175(B2) |
申请公布日期 |
2014.09.23 |
申请号 |
US201213619395 |
申请日期 |
2012.09.14 |
申请人 |
Mitsubishi Electric Corporation |
发明人 |
Fujii Hidenori |
分类号 |
H01L21/332 |
主分类号 |
H01L21/332 |
代理机构 |
Studebaker & Brackett PC |
代理人 |
Studebaker & Brackett PC |
主权项 |
1. A method for manufacturing a vertical trench IGBT comprising:
forming a body layer of a second conductivity type on a semiconductor substrate of a first conductivity type; forming a trench passing through the body layer; forming a trench gate in the trench via a gate insulating film; forming a substantially planar polysilicon film containing an impurity of a first conductivity type on the body layer; diffusing the impurity from the polysilicon film into the body layer to form an emitter layer of a first conductivity type on the body layer; and forming a collector layer of a second conductivity type on a lower surface of the semiconductor substrate, wherein the emitter layer includes a true emitter layer formed in the vicinity of the trench gate, and an exterior emitter layer for extruding the true emitter layer. |
地址 |
Tokyo JP |