发明名称 Vertical integrated semiconductor device with multiple continuous single crystal silicon layers vertically separated from one another
摘要 A vertically integrated semiconductor device includes multiple continuous single crystal silicon layers vertically separated from one another by a dielectric layer or layers. Semiconductor devices are disposed on an underlying single crystal silicon substrate and the continuous single crystal silicon layers. The individual devices are interconnected to one another using tungsten or doped polysilicon leads that extend through openings formed in the continuous single crystal silicon layers. The method for forming the structure includes forming a dielectric material over the single crystal silicon layer or substrate and forming an opening extending down to the surface of the single crystal silicon material to act as a seed layer. An epitaxial silicon growth process begins at the seed location and laterally overgrows the openings. Growth fronts from the various seed locations meet to form a continuous single crystal silicon layer which is then polished.
申请公布号 US8841676(B2) 申请公布日期 2014.09.23
申请号 US201313932776 申请日期 2013.07.01
申请人 Wafertech, LLC 发明人 Piper Daniel
分类号 H01L29/10;H01L27/085;H01L27/06;H01L27/12 主分类号 H01L29/10
代理机构 Duane Morris LLP 代理人 Duane Morris LLP
主权项 1. A vertically integrated semiconductor device comprising a plurality of vertically spaced continuous single crystal silicon layers disposed over a substrate, each of said continuous single crystal silicon layers spaced from an adjacent one of said continuous single crystal silicon layers by at least an interposed dielectric layer and each of said continuous single crystal silicon layers coupled to an adjacent one of said continuous single crystal silicon layers by stems extending through said associated interposed dielectric layer, each said continuous single crystal silicon layer including semiconductor devices formed thereon, and conductive interconnect structures extending through at least one said continuous single crystal silicon layer, each said conductive interconnect structure spaced from said at least one said continuous single crystal silicon layer by a dielectric liner surrounding each said conductive interconnect structure.
地址 Camas WA US