发明名称 MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>A memory device comprises: a gate structure which includes a first conductive film pattern and a second conductive film pattern, having a smaller resistance than the first conductive film pattern, wherein the first conductive film pattern and the second conductive film pattern are sequentially stacked on a substrate; a contact plug penetrating through the second conductive film pattern and a part of the first conductive film pattern in which a side wall directly comes into contact with at least a part of the second conductive film pattern; and a spacer which surrounds a part of the side wall of the contact plug and comes into contact with the gate structure.</p>
申请公布号 KR20140112263(A) 申请公布日期 2014.09.23
申请号 KR20130026790 申请日期 2013.03.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, HAUK;KIM, IL WOO;LEE, JEONG GIL;KWON, YONG IL;LEE, MYOUNG BUM
分类号 H01L27/108;H01L21/28;H01L21/8242 主分类号 H01L27/108
代理机构 代理人
主权项
地址