发明名称 |
MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>A memory device comprises: a gate structure which includes a first conductive film pattern and a second conductive film pattern, having a smaller resistance than the first conductive film pattern, wherein the first conductive film pattern and the second conductive film pattern are sequentially stacked on a substrate; a contact plug penetrating through the second conductive film pattern and a part of the first conductive film pattern in which a side wall directly comes into contact with at least a part of the second conductive film pattern; and a spacer which surrounds a part of the side wall of the contact plug and comes into contact with the gate structure.</p> |
申请公布号 |
KR20140112263(A) |
申请公布日期 |
2014.09.23 |
申请号 |
KR20130026790 |
申请日期 |
2013.03.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN, HAUK;KIM, IL WOO;LEE, JEONG GIL;KWON, YONG IL;LEE, MYOUNG BUM |
分类号 |
H01L27/108;H01L21/28;H01L21/8242 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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