发明名称 DITCHES NEAR SEMICONDUCTOR FINS AND METHODS FOR FORMING THE SAME
摘要 <p>A device includes a semiconductor substrate and isolation regions which are extended to the inner part of the semiconductor substrate. A semiconductor strip is located between the isolation regions and is in contact with the isolation regions. A semiconductor fin is overlapped with the semiconductor strip and is combined with the semiconductor strip. A ditch is extended from the upper end surface of the isolation regions to the inner part of the isolation regions. The ditch is adjacent to the semiconductor fin.</p>
申请公布号 KR20140112354(A) 申请公布日期 2014.09.23
申请号 KR20130099513 申请日期 2013.08.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 VAN DAL MARK
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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