发明名称 SPECTRUM DISPERSION MEMS SELF-TESTING SYSTEM AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a MEMS sensor that has a spectrum dispersion modulation self-testing capability.SOLUTION: A MEMS sensor comprises: a detection circuit 106 that is configured so as to detect a stimulant generated by a microelectromechanical system 102 in a sensor band width of a device output signal; and a self-test circuit 112 that generates a test output signal 130 indicative of a status of the microelectromechanical system 102 by injecting a self-test signal 114 in a signal route of the microelectromechanical system 102 including a MEMS structure having something to do with a generation of the stimulant in the sensor band width of the device output signal. The self-test signal 114 is a spectrum dispersion signal that has a test signal band width overlapped with at least one part of the sensor band width.
申请公布号 JP2014174175(A) 申请公布日期 2014.09.22
申请号 JP20140044971 申请日期 2014.03.07
申请人 ANALOG DEVICES TECHNOLOGY 发明人 KAMATCHI SARAVANAN ALAGARSAMY;WILLIAM A CLARK;JISHNU CHOYI;JAMES M LEE;VIKAS CHOUDHARY
分类号 G01P21/00;G01C19/5776;G01D21/00;G01R31/28 主分类号 G01P21/00
代理机构 代理人
主权项
地址