发明名称 |
SPECTRUM DISPERSION MEMS SELF-TESTING SYSTEM AND METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a MEMS sensor that has a spectrum dispersion modulation self-testing capability.SOLUTION: A MEMS sensor comprises: a detection circuit 106 that is configured so as to detect a stimulant generated by a microelectromechanical system 102 in a sensor band width of a device output signal; and a self-test circuit 112 that generates a test output signal 130 indicative of a status of the microelectromechanical system 102 by injecting a self-test signal 114 in a signal route of the microelectromechanical system 102 including a MEMS structure having something to do with a generation of the stimulant in the sensor band width of the device output signal. The self-test signal 114 is a spectrum dispersion signal that has a test signal band width overlapped with at least one part of the sensor band width. |
申请公布号 |
JP2014174175(A) |
申请公布日期 |
2014.09.22 |
申请号 |
JP20140044971 |
申请日期 |
2014.03.07 |
申请人 |
ANALOG DEVICES TECHNOLOGY |
发明人 |
KAMATCHI SARAVANAN ALAGARSAMY;WILLIAM A CLARK;JISHNU CHOYI;JAMES M LEE;VIKAS CHOUDHARY |
分类号 |
G01P21/00;G01C19/5776;G01D21/00;G01R31/28 |
主分类号 |
G01P21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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