发明名称 TERAHERTZ WAVE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To promote cooling or heat radiation of a generating element and the like for generating terahertz wave.SOLUTION: A terahertz wave measuring device (100) has: generation means (110) generating a terahertz wave by being irradiated with a first laser beam (LB1); detection means (130) detecting the terahertz wave emitted from the generation means to a measurement object, by being irradiated with a second laser beam (LB2); reflection means (121) reflecting and emitting incident light; movement means (124, 221) moving the reflection means to an optical axis direction of the incident light; adjustment means (120, 220) adjusting an optical path length difference between an optical path length of the first laser beam and an optical path length of the second laser beam by the movement of the reflection means; and deflection means (125, 230, 235) provided in the adjustment means, and directing a movement direction of an air moving according to the movement of the reflection means toward a predetermined direction in which a cooled object to be cooled can be cooled.
申请公布号 JP2014174154(A) 申请公布日期 2014.09.22
申请号 JP20130050308 申请日期 2013.03.13
申请人 PIONEER ELECTRONIC CORP 发明人 MIURA MASAHIRO ; KOBAYASHI HIDEKI ; NAKANO MASAHARU ; YAMAGUCHI ATSUSHI
分类号 G01N21/35 主分类号 G01N21/35
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