METHOD AND APPARATUS FOR FORMING CHARACTERIZATION PARAMETER OF RESISTIVE MEMORY ELEMENT

摘要

PROBLEM TO BE SOLVED: To form a characterization parameter of a resistive memory element.SOLUTION: An incremental signal is defined that includes at least one of a duration and a peak voltage that is less than a minimum programming time or minimum programming voltage step of each resistive memory element. A characterization procedure is repeatedly performed that at least involves: applying a signal to the memory element, the signal being incremented by the incremental signal during each subsequent application; measuring a first resistance of the memory element in response to the signal; and c) measuring a second resistance of the memory element after a time period has elapsed from the measurement of the first resistance with no programming signal applied. In response to the first and second resistance measurements of the characterization procedure, a characterization parameter of the memory element is formed.