发明名称 FORMATION OF A HIGH ASPECT RATIO CONTACT HOLE
摘要 A small contact hole having a large aspect ratio is formed by employing a stop layer with a trench formed therein. A relatively large contact hole is formed above the trench, and the small contact hole is formed below the trench, using properties of the trench and the stop layer to limit the size of the small contact hole.
申请公布号 US2014264782(A1) 申请公布日期 2014.09.18
申请号 US201313875998 申请日期 2013.05.02
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 YANG ZUSING;HSU FANG-HAO;LEE HONG-JI
分类号 H01L21/768;H01L23/498;H01L29/06 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method, comprising: providing a semiconductor film stack having a first plurality of layers including a contact layer; disposing a stop layer over the first plurality of layers; introducing a trench into the stop layer, thereby forming a shaped stop layer, the trench having an upper width and a lower width, the lower width being less than the upper width; placing a second plurality of layers into the trench and above the shaped stop layer; forming a relatively large contact hole through the second plurality of layers; and forming a relatively small contact hole extending downward from a lower extent of the trench to the contact layer, the small contact hole having a cross-section substantially the same as the lower width of the trench.
地址 Hsinchu TW