发明名称 DAMASCENE CONDUCTOR FOR A 3D DEVICE
摘要 A method of forming a conductor structure can result in vertical sidewalls. The method deposits a lining over a plurality of spaced-apart stacks of active layers. An isolation material is formed over the lining, over and in between the spaced-apart stacks. A plurality of trenches in the isolation material is arranged to cross over the plurality of spaced-apart stacks of active strips, leaving at least a residue of the lining on a bottom of the trenches between the stacks of active strips and over a sidewall of the spaced-apart stacks of active strips. The residue of the lining on the bottom of the trenches and the sidewalls of the spaced-apart stacks of active layers is selectively removed. Then the plurality of trenches is filled with conductive or semiconductor material to form the damascene structure.
申请公布号 US2014264897(A1) 申请公布日期 2014.09.18
申请号 US201313935375 申请日期 2013.07.03
申请人 Macronix International Co., Ltd. 发明人 CHIU CHIAJUNG;LEE GUANRU
分类号 H01L21/768;H01L23/535 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of forming conductors in a 3D circuit; comprising: providing a substrate having a plurality of spaced-apart stacks of active strips; depositing a lining over the plurality of spaced-apart stacks of active strips;depositing an insulating fill material over the lining, over and in between the spaced-apart stacks; using a first etch process, forming a plurality of trenches in the insulating fill material arranged to cross over the plurality of spaced-apart stacks; using a second etch process, removing the lining exposed within the trenches; and filling the plurality of trenches with a conductor or semiconductor material to form damascene conductor structures.
地址 Hsinchu TW