发明名称 |
Interconnection Structure And Method For Semiconductor Device |
摘要 |
A semiconductor device is disclosed. The device includes a substrate, a first dielectric layer disposed over the substrate and a metal structure disposed in the first dielectric layer and below a surface of the first dielectric layer. The metal structure has a such shape that having an upper portion with a first width and a lower portion with a second width. The second width is substantially larger than the first width. The semiconductor device also includes a sub-structure of a second dielectric positioned between the upper portion of the metal structure and the first dielectric layer. |
申请公布号 |
US2014264873(A1) |
申请公布日期 |
2014.09.18 |
申请号 |
US201313936942 |
申请日期 |
2013.07.08 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Ting Chih-Yuan;Wu Chung-Wen |
分类号 |
H01L29/45;H01L21/283 |
主分类号 |
H01L29/45 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a substrate; a first dielectric layer disposed over the substrate; a metal structure disposed in the first dielectric layer and below a surface of the first dielectric layer, the metal structure having a shape that includes:
an upper portion with a first width; anda lower portion with a second width, which is substantially larger than the first width, whereby a notch is formed in the metal structure; and a second dielectric sub-structure positioned in the notch between the upper portion of the metal structure and the first dielectric layer. |
地址 |
Hsin-Chu TW |