发明名称 Interconnection Structure And Method For Semiconductor Device
摘要 A semiconductor device is disclosed. The device includes a substrate, a first dielectric layer disposed over the substrate and a metal structure disposed in the first dielectric layer and below a surface of the first dielectric layer. The metal structure has a such shape that having an upper portion with a first width and a lower portion with a second width. The second width is substantially larger than the first width. The semiconductor device also includes a sub-structure of a second dielectric positioned between the upper portion of the metal structure and the first dielectric layer.
申请公布号 US2014264873(A1) 申请公布日期 2014.09.18
申请号 US201313936942 申请日期 2013.07.08
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Ting Chih-Yuan;Wu Chung-Wen
分类号 H01L29/45;H01L21/283 主分类号 H01L29/45
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate; a first dielectric layer disposed over the substrate; a metal structure disposed in the first dielectric layer and below a surface of the first dielectric layer, the metal structure having a shape that includes: an upper portion with a first width; anda lower portion with a second width, which is substantially larger than the first width, whereby a notch is formed in the metal structure; and a second dielectric sub-structure positioned in the notch between the upper portion of the metal structure and the first dielectric layer.
地址 Hsin-Chu TW
您可能感兴趣的专利