| 发明名称 |
METHOD AND A SYSTEM FOR A STATISTICAL EQUIVALENCE TEST |
| 摘要 |
A method of performing a statistical equivalence test including first deciding if process data has equivalence, non-equivalence or improvement by comparing a statistical value of the process data with a criteria statistical value, correcting the criteria statistical value using a statistical tolerance for the process data that has the non-equivalence or improvement, and second deciding if the process data that has the non-equivalence or improvement has acceptance or non-equivalence by comparing the process data that has the non-equivalence or improvement with the corrected criteria statistical value. |
| 申请公布号 |
US2014278234(A1) |
申请公布日期 |
2014.09.18 |
| 申请号 |
US201414188952 |
申请日期 |
2014.02.25 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHANG In-Kap;TONG Seung-Hoon;CHOI Soo-Hyuck |
| 分类号 |
G06F17/18 |
主分类号 |
G06F17/18 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of performing a statistical equivalence test, the method comprising:
first deciding if process data has equivalence, non-equivalence or improvement by comparing a statistical value of the process data with a criteria statistical value; correcting the criteria statistical value using a statistical tolerance for the process data that has the non-equivalence or improvement; and second deciding if the process data that has the non-equivalence or improvement has acceptance or non-equivalence by comparing the process data that has the non-equivalence or improvement with the corrected criteria statistical value. |
| 地址 |
Gyeonggi-do KR |
