发明名称 TRACK PROCESSING TO REMOVE ORGANIC FILMS IN DIRECTED SELF-ASSEMBLY CHEMO-EPITAXY APPLICATIONS
摘要 A method is provided for preparing a prepatterned substrate for use in DSA integration. In one example, the method includes removing a radiation-sensitive material pattern overlying a patterned cross-linked polystyrene copolymer layer by a) exposure to a solvent vapor, b) exposure to a liquid solvent, and c) repeating steps a)-b) until the radiation-sensitive material pattern is completely removed. In another example, the method includes removing a neutral layer by affecting removal of an underlying patterned radiation-sensitive material layer, which includes swelling the neutral layer; and removing the radiation-sensitive material pattern and the swollen neutral layer in portions by exposing the swollen layer and pattern to a developer solution. Swelling the neutral layer includes a) exposure to a solvent vapor; b) exposure to a liquid solvent; and c) repeating steps a)-b) until the neutral layer is sufficiently swollen to allow penetration of the developing solution through the swollen neutral layer.
申请公布号 US2014273472(A1) 申请公布日期 2014.09.18
申请号 US201414208160 申请日期 2014.03.13
申请人 Tokyo Electron Limited 发明人 Somervell Mark H.;Hetzer David;Huli Lior
分类号 H01L21/311 主分类号 H01L21/311
代理机构 代理人
主权项 1. A method for forming a prepattern, comprising: providing a substrate with a radiation-sensitive material pattern overlying a patterned cross-linked polystyrene copolymer layer; and removing the radiation-sensitive material pattern overlying the patterned cross-linked polystyrene copolymer layer, wherein the step of removing the radiation-sensitive material pattern overlying the patterned cross-linked polystyrene copolymer layer comprises: a) exposing the radiation-sensitive material pattern to a solvent vapor; b) exposing the radiation-sensitive material pattern to a liquid solvent; c) repeating steps a)-b) until the radiation-sensitive material pattern is completely removed.
地址 Tokyo JP