发明名称 SUBSTRATE WITH MULTILAYER REFLECTION FILM, MANUFACTURING METHOD THEREFOR, METHOD FOR MANUFACTURING REFLECTION-TYPE MASK BLANK, METHOD FOR MANUFACTURING REFLECTION-TYPE MASK, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a substrate with a multilayer reflection film, which has high reflectivity and is superior in cleaning resistance.SOLUTION: A substrate 10 with the multilayer reflection film comprises a multilayer reflection film 2 for reflecting exposure light on a substrate 1, and a protective film 3 for protecting the multilayer reflection film 2. The multilayer reflection film 2 has a multilayer film structure in which a plurality of cycles are laminated when a laminated structure having a low refractive index layer and a high refractive index layer are laminated is counted as one cycle. The protective film 3 are formed of a reflectivity reducing and suppressing layer 31, a blocking layer 32 and an etching stopper layer 33 laminated in this order.</p>
申请公布号 JP2014170931(A) 申请公布日期 2014.09.18
申请号 JP20140023538 申请日期 2014.02.10
申请人 HOYA CORP 发明人 ONOE TAKAHIRO;HAMAMOTO KAZUHIRO;IKEBE YOHEI
分类号 H01L21/027;G03F1/24;G03F7/20 主分类号 H01L21/027
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