发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 A method of manufacturing a semiconductor device including a wafer using a plasma etching device which includes a chamber, a chuck provided in the chamber to dispose a wafer to be processed thereon, a focus ring disposed at a peripheral edge portion of the chuck, and a gas supplying mechanism configured to supply various types of gases depending a radial position of the wafer. The method includes: placing a wafer formed with an organic film on the chuck; introducing an etching gas which etches the organic film on the wafer from the process gas supplying mechanism to a central portion of the wafer; introducing an etching inhibiting factor gas having a property of reacting with the etching gas to the peripheral edge portion of the wafer from the gas supplying mechanism; and performing plasma etching on the wafer using the etching gas.
申请公布号 US2014273486(A1) 申请公布日期 2014.09.18
申请号 US201214353451 申请日期 2012.10.25
申请人 TOKYO ELECTRON LIMITED 发明人 Katsunuma Takayuki;Honda Masanobu;Kubota Kazuhiro;Ichikawa Hironobu
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device including a wafer using a plasma etching device which includes a chamber, a chuck provided in the chamber so as to dispose a wafer to be processed thereon, a focus ring disposed at a peripheral edge portion of the chuck to surround the disposed position of the wafer, and a gas supplying mechanism configured to supply various types of gases depending a radial position of the wafer, the method comprising: placing a wafer formed with an organic film on the chuck; introducing an etching gas which etches the organic film on the wafer from the process gas supplying mechanism to a central portion of the wafer; introducing an etching inhibiting factor gas having a property of reacting with the etching gas to the peripheral edge portion of the wafer from the gas supplying mechanism; and performing plasma etching on the wafer using the etching gas.
地址 Tokyo JP