发明名称 MEMORY DEVICE AND METHOD FOR WRITING THEREFOR
摘要 A method of writing a memory cell includes, during a write cycle, causing a voltage level at a power terminal of the memory cell to change from a supply voltage level toward a first voltage level. The voltage level at the power terminal of the memory cell is maintained at the first voltage level for a first predetermined duration. The voltage level at the power terminal of the memory cell is maintained at a second voltage level for a second predetermined duration, where the second voltage level is between the first voltage level and the supply voltage level. During the write cycle, the voltage level at the power terminal of the memory cell is caused to change from the first voltage level toward the supply voltage level.
申请公布号 US2014269024(A1) 申请公布日期 2014.09.18
申请号 US201414291162 申请日期 2014.05.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHEN Yen-Huei;WANG Li-Wen;LIN Chih-Yu
分类号 G11C11/419 主分类号 G11C11/419
代理机构 代理人
主权项 1. A method of writing a memory cell, comprising: during a write cycle: causing a voltage level at a power terminal of the memory cell to change from a supply voltage level toward a first voltage level;maintaining the voltage level at the power terminal of the memory cell at the first voltage level for a first predetermined duration;maintaining the voltage level at the power terminal of the memory cell at a second voltage level for a second predetermined duration, the second voltage level being between the first voltage level and the supply voltage level; andcausing the voltage level at the power terminal of the memory cell to change from the first voltage level toward the supply voltage level.
地址 Hsinchu TW