发明名称 Transmission Electron Microscope, and Method of Observing Specimen
摘要 Provided is means which enables observation of the shape of a specimen as it is without deforming the specimen. Observation is made by allowing a specimen-holding member having an opening (for example, microgrid and mesh) to hold an ionic liquid and charging a specimen thereto, to allow the specimen to suspend in the ionic liquid. Furthermore, in the proximity of the specimen-holding member, a mechanism of injecting an ionic liquid (ionic liquid introduction mechanism) and/or an electrode are provided. When a voltage is applied to the electrode, the specimen moves or deforms in the ionic liquid. How the specimen moves or deforms can be observed. Furthermore, in the proximity of specimen-holding member, an evaporation apparatus is provided to enable charge of the specimen into the ionic liquid while evaporating. Furthermore, in the proximity of the specimen-holding member, a microcapillary is provided to charge a liquid-state specimen into the ionic liquid. Note that the specimen-holding member is designed to be rotatable.
申请公布号 US2014264017(A1) 申请公布日期 2014.09.18
申请号 US201414289092 申请日期 2014.05.28
申请人 Hitachi High-Technologies Corporation 发明人 NAKAZAWA Eiko;KOBAYASHI Hiroyuki;KUWABATA Susumu
分类号 H01J37/20;G01N23/04;H01J37/26 主分类号 H01J37/20
代理机构 代理人
主权项 1. A specimen holder for observing a specimen by a transmission electron microscope, the specimen holder comprising: a holder member having an opening for transmitting an electron beam and for holding, entirely by surface tension, an ionic liquid having the specimen charged therein, wherein the ionic liquid fills the entire opening.
地址 Tokyo JP