发明名称 |
MULTI-LAYER METAL CONTACS |
摘要 |
A method for forming metal contacts within a semiconductor device includes a step of forming a first-layer contact in a first dielectric layer which surrounds at least one gate electrode, wherein the first-layer contact extends to a doped region of an underlying substrate. The method further includes the steps of: forming a second dielectric layer on the first dielectric layer; and forming a second-layer contact extended through the second dielectric layer to the first-layer contact. |
申请公布号 |
KR20140111215(A) |
申请公布日期 |
2014.09.18 |
申请号 |
KR20130127667 |
申请日期 |
2013.10.25 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
SHIEH MING FENG;TSENG WEN HUNG;LAI CHIH MING;HSIEH KEN HSIEN;GAU TSAI SHENG;LIU RU GUN |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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