发明名称 MULTI-LAYER METAL CONTACS
摘要 A method for forming metal contacts within a semiconductor device includes a step of forming a first-layer contact in a first dielectric layer which surrounds at least one gate electrode, wherein the first-layer contact extends to a doped region of an underlying substrate. The method further includes the steps of: forming a second dielectric layer on the first dielectric layer; and forming a second-layer contact extended through the second dielectric layer to the first-layer contact.
申请公布号 KR20140111215(A) 申请公布日期 2014.09.18
申请号 KR20130127667 申请日期 2013.10.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 SHIEH MING FENG;TSENG WEN HUNG;LAI CHIH MING;HSIEH KEN HSIEN;GAU TSAI SHENG;LIU RU GUN
分类号 H01L21/28 主分类号 H01L21/28
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