发明名称 Hydrogen Plasma Cleaning of Germanium Oxide Surfaces
摘要 Methods and apparatus for processing using a remote plasma source are disclosed. The apparatus includes an outer chamber enclosing a substrate support, a remote plasma source, and a showerhead. A substrate heater can be mounted in the substrate support. A transport system moves the substrate support and is capable of positioning the substrate. The plasma system may be used to generate activated hydrogen species. The activated hydrogen species can be used to etch/clean semiconductor oxide surfaces such as silicon oxide or germanium oxide.
申请公布号 US2014273493(A1) 申请公布日期 2014.09.18
申请号 US201314031975 申请日期 2013.09.19
申请人 Intermolecular, Inc. 发明人 Limdulpaiboon Ratsamee;Lang Chi-I;Niyogi Sandip;Watanabe J.
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
主权项 1. A method for etching a layer, the method comprising: providing a substrate, wherein the substrate comprises a semiconductor oxide layer formed thereon; exposing the semiconductor oxide layer to activated hydrogen species, wherein the activated hydrogen species are formed using a plasma source, and wherein the activated hydrogen species are operable to remove at least a portion of the semiconductor oxide layer.
地址 San Jose CA US