| 发明名称 |
SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CONTROLLING THE SAME |
| 摘要 |
A semiconductor memory device comprises an inner circuit, an output buffer circuit, an output buffer controlling circuit, and a chip operation temperature sensor. The output buffer circuit outputs data from the inner circuit via a data input/output pad. The output buffer controlling circuit controls a driving power of the output buffer circuit. The chip operation temperature sensor detects an operation temperature of a chip of the semiconductor device. The output buffer controlling circuit selects an impedance controlling condition from a plurality of the impedance controlling conditions according to the output signal of the chip operation temperature sensor and controls the output buffer circuit according to the selected impedance controlling condition. |
| 申请公布号 |
US2014269107(A1) |
申请公布日期 |
2014.09.18 |
| 申请号 |
US201314023603 |
申请日期 |
2013.09.11 |
| 申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
INOUE Satoshi;SHIMIZU Yuui |
| 分类号 |
G11C7/10 |
主分类号 |
G11C7/10 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor device, comprising:
an inner circuit; an output buffer circuit outputting data from the inner circuit via a data input/output pad; an output buffer controlling circuit controlling a driving power of the output buffer circuit; and a chip operation temperature sensor detecting an operation temperature of a chip of the semiconductor device, wherein the output buffer controlling circuit selects an impedance controlling condition from a plurality of the impedance controlling conditions according to the output signal of the chip operation temperature sensor and controls the output buffer circuit according to the selected impedance controlling condition. |
| 地址 |
Minato-ku JP |
