发明名称 |
Measure-Based Delay Circuit |
摘要 |
A master measure circuit is disclosed that may select from various nodes on a delay path carrying a signal. The master measure circuit measures the delay for propagation of the signal from one selected node to another selected node and controls an adjustable delay circuit in the delay path accordingly. |
申请公布号 |
US2014266357(A1) |
申请公布日期 |
2014.09.18 |
申请号 |
US201313831201 |
申请日期 |
2013.03.14 |
申请人 |
QUALCOMM INCORPORATED |
发明人 |
Srinivas Vaishnav;Diffenderfer Jan;Clovis Philip Michael;West David Ian |
分类号 |
H03K5/159 |
主分类号 |
H03K5/159 |
代理机构 |
|
代理人 |
|
主权项 |
1. A circuit, comprising:
a delay path including a plurality of nodes and a slave adjustable delay circuit; a master measure circuit configured to measure a delay between selected ones of the nodes for a signal propagated through the delay path, the master measure circuit being further configured to adjust the slave adjustable delay circuit responsive to the measured delay. |
地址 |
San Diego CA US |