发明名称 ADHESION IMPROVEMENT BETWEEN CVD DIELECTRIC FILM AND CU SUBSTRATE
摘要 Methods of forming dielectric layers on a copper substrate are disclosed herein. In one embodiment, a method of depositing a dielectric layer can include positioning a copper substrate in a process chamber, forming and delivering the cleaning plasma to the substrate to form a cleaned surface on the substrate, forming and delivering the adhesion plasma to the surface of the substrate to form a copper compound thereon and depositing a dielectric layer over the copper compound. In another embodiment, a method of depositing a dielectric layer can include positioning a copper substrate in a process chamber, delivering an adhesion plasma to the copper substrate to form a copper compound and flowing a deposition gas into the process chamber to deposit a dielectric layer over the copper compound, wherein the flow between the adhesion plasma and the deposition gas is continuous.
申请公布号 US2014272187(A1) 申请公布日期 2014.09.18
申请号 US201414180339 申请日期 2014.02.13
申请人 Applied Materials, Inc. 发明人 WON Tae Kyung;CUI Yi;PARK Beom Soo;CHOI Soo Young
分类号 C23C16/02;C23C16/34 主分类号 C23C16/02
代理机构 代理人
主权项 1. A method of depositing a dielectric layer comprising: positioning a copper substrate in a process chamber; forming a cleaning plasma from a cleaning gas; delivering the cleaning plasma to the substrate to form a cleaned surface on the substrate; forming an adhesion plasma from a compound-forming gas; delivering the adhesion plasma to the surface of the substrate to form a copper compound thereon; and depositing a dielectric layer over the copper compound.
地址 Santa Clara CA US