发明名称 PHOTORESIST SYSTEM AND METHOD
摘要 A system and method for photoresists is provided. In an embodiment a cross-linking or coupling reagent is included within a photoresist composition. The cross-linking or coupling reagent will react with the polymer resin within the photoresist composition to cross-link or couple the polymers together, resulting in a polymer with a larger molecular weight. This larger molecular weight will cause the dissolution rate of the photoresist to decrease, leading to a better depth of focus for the line.
申请公布号 US2014273521(A1) 申请公布日期 2014.09.18
申请号 US201313829301 申请日期 2013.03.14
申请人 Ltd. Taiwan Semiconductor Manufacturing Company, 发明人 Wu Chen-Hau;Chang Ching-Yu
分类号 H01L21/027;G03F7/038 主分类号 H01L21/027
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor device, the method comprising: applying a photoresist to a substrate, the photoresist comprising a resin, the resin comprising a plurality of polymers, each one of the plurality of polymers comprising a backbone; exposing the photoresist to a patterned energy, the patterned energy inducing a reaction to form a bond between a backbone of a first one of the plurality of polymers and a backbone of a second one of the plurality of polymers; and developing the photoresist after the exposing the photoresist, the developing being performed with a negative tone developer.
地址 US