发明名称 |
PHOTORESIST SYSTEM AND METHOD |
摘要 |
A system and method for photoresists is provided. In an embodiment a cross-linking or coupling reagent is included within a photoresist composition. The cross-linking or coupling reagent will react with the polymer resin within the photoresist composition to cross-link or couple the polymers together, resulting in a polymer with a larger molecular weight. This larger molecular weight will cause the dissolution rate of the photoresist to decrease, leading to a better depth of focus for the line. |
申请公布号 |
US2014273521(A1) |
申请公布日期 |
2014.09.18 |
申请号 |
US201313829301 |
申请日期 |
2013.03.14 |
申请人 |
Ltd. Taiwan Semiconductor Manufacturing Company, |
发明人 |
Wu Chen-Hau;Chang Ching-Yu |
分类号 |
H01L21/027;G03F7/038 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor device, the method comprising:
applying a photoresist to a substrate, the photoresist comprising a resin, the resin comprising a plurality of polymers, each one of the plurality of polymers comprising a backbone; exposing the photoresist to a patterned energy, the patterned energy inducing a reaction to form a bond between a backbone of a first one of the plurality of polymers and a backbone of a second one of the plurality of polymers; and developing the photoresist after the exposing the photoresist, the developing being performed with a negative tone developer. |
地址 |
US |