| 摘要 |
Provided is an eddy current flaw detection technology capable of recognizing changes in detection sensitivity resulting from changes in probe posture, even when inspecting inspection objects having a narrow section having a small radius of curvature. An eddy current flaw detection device (10) comprises: an AC power supply (14) that causes an excitation magnetic field to be generated in excitation coils (12a) housed in a probe (11) and causes an eddy current to be excited in the inspection object (13); a detection unit (15) that detects detection signals generated by detection coils (12b) housed in the probe (11), by using an induced magnetic field from this eddy current; a detection unit (16) that outputs flaw detection data on the basis of these detection signals; a storage unit (17) that associates, to each other, detection signals that have been detected at the same timing from a plurality of detection coils (12b), and stores same; and an evaluation unit (18) that evaluates the posture of the probe (11) at the same timing, on the basis of a plurality of detection signals associated in this way. |
