发明名称 Sidewall-Type Memory Cell
摘要 A sidewall-type memory cell (e.g., a CBRAM, ReRAM, or PCM cell) may include a bottom electrode, a top electrode layer defining a sidewall, and an electrolyte layer arranged between the bottom and top electrode layers, such that a conductive path is defined between the bottom electrode and a the top electrode sidewall via the electrolyte layer, wherein the bottom electrode layer extends generally horizontally with respect to a horizontal substrate, and the top electrode sidewall extends non-horizontally with respect to the horizontal substrate, such that when a positive bias-voltage is applied to the cell, a conductive path grows in a non-vertical direction (e.g., a generally horizontal direction or other non-vertical direction) between the bottom electrode and the top electrode sidewall.
申请公布号 US2014264248(A1) 申请公布日期 2014.09.18
申请号 US201414183831 申请日期 2014.02.19
申请人 Microchip Technology Incorporated 发明人 Sato Justin Hiroki;Chen Bomy;Daryanani Sonu
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A cell for a resistive memory, comprising: a bottom electrode; a top electrode layer defining a sidewall; and an electrolyte layer arranged between the bottom and top electrode layers, such that a conductive path is defined between the bottom electrode and the top electrode sidewall via the electrolyte layer; and wherein the bottom electrode layer extends generally horizontally with respect to a horizontal substrate, and the top electrode sidewall extends non-horizontally with respect to the horizontal substrate.
地址 Chandler AZ US