发明名称 SUSCEPTOR SUPPORT SHAFT WITH UNIFORMITY TUNING LENSES FOR EPI PROCESS
摘要 Embodiments of the invention generally relate to susceptor support shafts and process chambers containing the same. A susceptor support shaft supports a susceptor thereon, which in turn, supports a substrate during processing. The susceptor support shaft reduces variations in temperature measurement of the susceptor and/or substrate by providing a consistent path for a pyrometer focal beam directed towards the susceptor and/or substrate, even when the susceptor support shaft is rotated. The susceptor support shafts also have a relatively low thermal mass which increases the ramp up and ramp down rates of a process chamber. In some embodiments, a custom made refractive element can be removably placed on the top of the solid disc to redistribute secondary heat distributions across the susceptor and/or substrate for optimum thickness uniformity of epitaxy process.
申请公布号 US2014263268(A1) 申请公布日期 2014.09.18
申请号 US201414181035 申请日期 2014.02.14
申请人 Applied Materials, Inc. 发明人 Cong Zhepeng;Ramachandran Balasubramanian;Ishii Masato;Li Xuebin;Samir Mehmet Tugrul;Lau Shu-Kwan;Brillhart Paul
分类号 H05B3/02 主分类号 H05B3/02
代理机构 代理人
主权项 1. A susceptor support shaft for a process chamber, comprising: a cylindrical support shaft; and a support body coupled the support shaft, the support body comprising: a solid disc;a plurality of tapered bases extending from the solid disc;at least three support arms extending from some of the tapered bases; andat least three dummy arms extending from some of the tapered bases.
地址 Santa Clara CA US