发明名称 |
SUSCEPTOR SUPPORT SHAFT WITH UNIFORMITY TUNING LENSES FOR EPI PROCESS |
摘要 |
Embodiments of the invention generally relate to susceptor support shafts and process chambers containing the same. A susceptor support shaft supports a susceptor thereon, which in turn, supports a substrate during processing. The susceptor support shaft reduces variations in temperature measurement of the susceptor and/or substrate by providing a consistent path for a pyrometer focal beam directed towards the susceptor and/or substrate, even when the susceptor support shaft is rotated. The susceptor support shafts also have a relatively low thermal mass which increases the ramp up and ramp down rates of a process chamber. In some embodiments, a custom made refractive element can be removably placed on the top of the solid disc to redistribute secondary heat distributions across the susceptor and/or substrate for optimum thickness uniformity of epitaxy process. |
申请公布号 |
US2014263268(A1) |
申请公布日期 |
2014.09.18 |
申请号 |
US201414181035 |
申请日期 |
2014.02.14 |
申请人 |
Applied Materials, Inc. |
发明人 |
Cong Zhepeng;Ramachandran Balasubramanian;Ishii Masato;Li Xuebin;Samir Mehmet Tugrul;Lau Shu-Kwan;Brillhart Paul |
分类号 |
H05B3/02 |
主分类号 |
H05B3/02 |
代理机构 |
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代理人 |
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主权项 |
1. A susceptor support shaft for a process chamber, comprising:
a cylindrical support shaft; and a support body coupled the support shaft, the support body comprising:
a solid disc;a plurality of tapered bases extending from the solid disc;at least three support arms extending from some of the tapered bases; andat least three dummy arms extending from some of the tapered bases. |
地址 |
Santa Clara CA US |