发明名称 |
COMPOSITION FOR FORMING UPPER LAYER FILM AND RESIST PATTERN FORMING METHOD USING SAME |
摘要 |
[Problem] To provide: a composition for forming an upper layer film, which enables the formation of a pattern that has excellent roughness and pattern shape in a pattern forming method by means of extreme ultraviolet light exposure; and a pattern forming method which uses this composition for forming an upper layer film. [Solution] A composition for forming an upper layer film, which is characterized by containing a triphenylene derivative having a hydrophilic group and a solvent; and a method wherein a pattern is formed by applying this composition to a resist surface and then exposing and developing this composition. This composition may additionally contain a polymer. |
申请公布号 |
WO2014142296(A1) |
申请公布日期 |
2014.09.18 |
申请号 |
WO2014JP56858 |
申请日期 |
2014.03.14 |
申请人 |
AZ ELECTRONIC MATERIALS MANUFACTURING (JAPAN) KK |
发明人 |
WANG XIAOWEI;OKAYASU TETSUO;PAWLOWSKI GEORG;KINUTA TAKAFUMI |
分类号 |
G03F7/11;C08F20/10;C08G63/133;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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