| 发明名称 |
LINEAR CAPACITIVE DISPLACEMENT SENSOR |
| 摘要 |
A method and system for measuring displacement of a structure is disclosed. The method and system comprise providing a first capacitance and providing a second capacitance. The first and second capacitances share a common terminal. The method and system further include determining a difference of the inverses of the value of the first and second capacitances when the structure is displaced. The first capacitance varies in inverse relation to the displacement of the structure. |
| 申请公布号 |
US2014266256(A1) |
申请公布日期 |
2014.09.18 |
| 申请号 |
US201313952281 |
申请日期 |
2013.07.26 |
| 申请人 |
InvenSense, Inc. |
发明人 |
CAGDASER Baris;CHEN Du;AKYOL Hasan;SHAEFFER Derek |
| 分类号 |
G01B7/14 |
主分类号 |
G01B7/14 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for measuring displacement of a structure, comprising:
providing a first capacitance; providing a second capacitance, wherein the first and second capacitances share a common terminal; and determining a difference of the inverses of the value of the first and second capacitances when the structure is displaced; wherein the first capacitance varies in inverse relation to the displacement of the structure. |
| 地址 |
Sunnyvale CA US |
