发明名称 APPARATUS AND TECHNIQUES FOR DETERMINING OBJECT DEPTH IN IMAGES
摘要 An apparatus may include an emitter to project a low resolution optical pattern and a high resolution optical pattern having a finer resolution than the low resolution optical pattern and a sensor to detect a composite image, where the composite image comprises a low resolution optical reflection pattern comprising reflection of the projected low resolution optical pattern and a high resolution optical reflection pattern comprising a reflection of the projected high resolution optical pattern. The apparatus may also include logic to determine object depth in a first depth range and object depth in a second depth range based upon the detected composite image. Other embodiments are disclosed and claimed.
申请公布号 US2014267701(A1) 申请公布日期 2014.09.18
申请号 US201313797885 申请日期 2013.03.12
申请人 AVIV ZIV;STANHILL DAVID 发明人 AVIV ZIV;STANHILL DAVID
分类号 G01C11/02 主分类号 G01C11/02
代理机构 代理人
主权项 1. An apparatus, comprising: an emitter to project a low resolution optical pattern and a high resolution optical pattern having a finer resolution than the low resolution optical pattern; a sensor to detect a composite image, the composite image comprising a low resolution optical reflection pattern comprising reflection of the projected low resolution optical pattern and a high resolution optical reflection pattern comprising a reflection of the projected high resolution optical pattern; and logic to determine object depth in a first depth range and object depth in a second depth range based upon the detected composite image.
地址 Bat Hefer IS