| 摘要 |
A nondestructive inspection device 1 comprises an X-ray indicator 20, a low-energy detector 32, a high-energy detector 42, a low-energy transmittance calculation unit 72, a high-energy transmittance calculation unit 74, a detection unit 76, and a correction unit 78. The calculation unit 72 calculates a value indicating the transmittance of transmission X-rays in a low energy range. The calculation unit 74 calculates a value indicating the transmittance of transmission X-rays in a high energy range. The detection unit 76 detects a positional deviation detail of the X-ray indicator 20 according to a ratio between the transmittances calculated by both of the calculation units 72, 74. When the positional deviation detail of the X-ray indicator 20 is detected by the detection unit 76, according to the positional deviation detail, the correction unit 78 corrects X-ray luminance data detected by the detectors 32, 42. |
