| 摘要 |
<p>An X-ray analyzing system for x-ray scattering analysis comprising an x-ray source for generating a beam of x-rays propagating along a transmission axis (3), at least one hybrid slit (5b) with an aperture which defines the shape of the cross section of the beam, a sample on which the beam shaped by the hybrid slit (5b) is directed, and an X-ray detector for detecting x-rays originating from the sample, wherein the hybrid slit (5b) comprises at least three hybrid slit elements (7), each hybrid slit element (7) comprising a single crystal substrate (8) bonded to a base (9) with a taper angel a‰ 0, the single crystal substrates (8) of the hybrid slit elements (7) limiting the aperture, is characterized in that the hybrid slit elements (7) are staggered with an offset along the transmission axis (3). The inventive X-ray analyzing system shows improved resolution and signal to noise ration.</p> |
