发明名称 A MULTILAYER CHEMICAL MECHANICAL POLISHING PAD WITH BROAD SPECTRUM, ENDPOINT DETECTION WINDOW
摘要 <p>Provided is a multilayer chemical mechanical polishing pad which has a polishing layer which has a polishing surface, a counterbore opening part, and a polishing layer surface region parallel to the polishing surface; a porous sub pad layer which has a lower surface and a porous sub pad layer interface region parallel to the lower surface; and a broad spectrum endpoint detection window block including a ring-type olefin addition polymer part. The broad spectrum endpoint detection window block represents uniform chemical composition across the thickness. A polishing layer interface region and porous sub pad layer interface region form a coextensive region. A multilayer chemical mechanical polishing pad has a penetration opening part extended from the polishing surface to the lower surface of the porous sub pad layer. The counterbore opening part is open on the polishing surface and expands the penetration opening part to form a ledge. A window block is arranged in the counterbore opening part.</p>
申请公布号 KR20140110786(A) 申请公布日期 2014.09.17
申请号 KR20140027129 申请日期 2014.03.07
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.;DOW GLOBAL TECHNOLOGIES LLC 发明人 REPPER ANGUS;JAMES DAVID B.;LEUGERS MARY A.;DEGROOT MARTY
分类号 H01L21/302 主分类号 H01L21/302
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