发明名称 Shared-diffusion standard cell architecture
摘要 A semiconductor standard cell includes an N-type diffusion area and a P-type diffusion area, both extending across the cell and also outside of the cell. The cell also includes a conductive gate above each diffusion area to create a semiconductive device. A pair of dummy gates are also above the N-type diffusion area and the P-type diffusion area creating a pair of dummy devices. The pair of dummy gates are disposed at opposite edges of the cell. The cell further includes a first conductive line configured to couple the dummy devices to power for disabling the dummy devices.
申请公布号 US8836040(B2) 申请公布日期 2014.09.16
申请号 US201213671114 申请日期 2012.11.07
申请人 QUALCOMM Incorporated 发明人 Kamal Pratyush;Terzioglu Esin;Vang Foua;Patel Prayag Bhanubhai;Nallapati Giridhar;Datta Animesh
分类号 H01L21/70;H01L21/8238;H01L29/66;H01L27/118;H01L27/02;H01L27/092 主分类号 H01L21/70
代理机构 代理人 Holdaway Paul S.
主权项 1. A semiconductor standard cell, comprising: an N-type diffusion area extending across the cell and also outside of the cell; a P-type diffusion area extending across the cell and also outside of the cell; at least one conductive gate above each diffusion area to create a semiconductive device; a pair of dummy gate, each dummy gate disposed above the N-type diffusion area and the P-type diffusion area to create at least a pair of dummy devices, the pair of dummy gates being disposed at opposite edges of the cell; and at least one first conductive line configured to couple at least one of the dummy devices to power for disabling the at least one dummy device.
地址 San Diego CA US