发明名称 |
Shared-diffusion standard cell architecture |
摘要 |
A semiconductor standard cell includes an N-type diffusion area and a P-type diffusion area, both extending across the cell and also outside of the cell. The cell also includes a conductive gate above each diffusion area to create a semiconductive device. A pair of dummy gates are also above the N-type diffusion area and the P-type diffusion area creating a pair of dummy devices. The pair of dummy gates are disposed at opposite edges of the cell. The cell further includes a first conductive line configured to couple the dummy devices to power for disabling the dummy devices. |
申请公布号 |
US8836040(B2) |
申请公布日期 |
2014.09.16 |
申请号 |
US201213671114 |
申请日期 |
2012.11.07 |
申请人 |
QUALCOMM Incorporated |
发明人 |
Kamal Pratyush;Terzioglu Esin;Vang Foua;Patel Prayag Bhanubhai;Nallapati Giridhar;Datta Animesh |
分类号 |
H01L21/70;H01L21/8238;H01L29/66;H01L27/118;H01L27/02;H01L27/092 |
主分类号 |
H01L21/70 |
代理机构 |
|
代理人 |
Holdaway Paul S. |
主权项 |
1. A semiconductor standard cell, comprising:
an N-type diffusion area extending across the cell and also outside of the cell; a P-type diffusion area extending across the cell and also outside of the cell; at least one conductive gate above each diffusion area to create a semiconductive device; a pair of dummy gate, each dummy gate disposed above the N-type diffusion area and the P-type diffusion area to create at least a pair of dummy devices, the pair of dummy gates being disposed at opposite edges of the cell; and at least one first conductive line configured to couple at least one of the dummy devices to power for disabling the at least one dummy device. |
地址 |
San Diego CA US |