发明名称 Multi charged particle beam writing apparatus
摘要 A multi charged particle beam writing apparatus includes a stage to mount a target object thereon and to be movable, an emission unit to emit a charged particle beam, an aperture member, in which a plurality of openings are formed, to produce multiple beams by letting a region including the whole of a plurality of openings be irradiated with the charged particle beam and letting portions of the charged particle beam respectively pass through a corresponding opening of a plurality of openings, a reduction optical system to reduce the multiple beams, and a doublet lens, arranged at the subsequent stage of the reduction optical system, in which a magnification is 1 and directions of magnetic fluxes are opposite.
申请公布号 US8835868(B2) 申请公布日期 2014.09.16
申请号 US201314108844 申请日期 2013.12.17
申请人 NuFlare Technology, Inc. 发明人 Touya Takanao;Ogasawara Munehiro
分类号 H01J3/07;H01J37/141;G21K5/04;H01J37/317 主分类号 H01J3/07
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A multi charged particle beam writing apparatus comprising: a stage configured to mount a target object thereon and to be movable; an emission unit configured to emit a charged particle beam; an aperture member, in which a plurality of openings are formed, configured to form multiple beams by letting a region including a whole of the plurality of openings be irradiated with the charged particle beam and letting portions of the charged particle beam respectively pass through a corresponding opening of the plurality of openings; a reduction optical system configured to reduce the multiple beams; and a doublet lens, arranged at a subsequent stage of the reduction optical system, in which a magnification is 1 and directions of magnetic fluxes are opposite.
地址 Yokohama JP
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