发明名称 |
Electronic component manufacturing method including step of embedding metal film |
摘要 |
The present invention provides an electronic component manufacturing method including a step of embedding a metal film. An embodiment of the present invention includes a first step of depositing a barrier layer containing titanium nitride on an object to be processed on which a concave part is formed and a second step of filling a low-melting-point metal directly on the barrier layer under a temperature condition allowing the low-melting-point metal to flow, by a PCM sputtering method while forming a magnetic field by a magnet unit including plural magnets which are arranged at grid points of a polygonal grid so as to have different polarities between the neighboring magnets. |
申请公布号 |
US8835296(B2) |
申请公布日期 |
2014.09.16 |
申请号 |
US201113163989 |
申请日期 |
2011.06.20 |
申请人 |
Canon Anelva Corporation |
发明人 |
Wakayanagi Shunichi;Saito Takayuki;Seino Takuya;Matsuo Akira;Yamazaki Koji;Morimoto Eitaro;Shibuya Yohsuke;Sato Yu;Kitano Naomu |
分类号 |
H01L29/45;H01L21/285 |
主分类号 |
H01L29/45 |
代理机构 |
Fitzpatrick, Cella, Harper & Scinto |
代理人 |
Fitzpatrick, Cella, Harper & Scinto |
主权项 |
1. An electronic component manufacturing method of gate last method having a first step of forming a high-permittivity insulating film in a trench formed on an object to be processed; and a second step of forming a metal nitride film for controlling an operation voltage on the high-permittivity insulating film, the method comprising:
a third step of depositing, at room temperature, a single barrier film including titanium nitride on the metal nitride film for controlling the operation voltage by a sputtering method while forming a cusped magnetic field on a target surface, wherein a surface roughness of the single barrier film is less than 0.479 nm; and a fourth step of filling a low-melting-point metal film directly on the single barrier film under a temperature condition allowing the low-melting-point metal film to flow. |
地址 |
Kawasaki-shi JP |