发明名称 |
Semiconductor structure and process thereof |
摘要 |
A semiconductor structure includes a work function metal layer, a (work function) metal oxide layer and a main electrode. The work function metal layer is located on a substrate. The (work function) metal oxide layer is located on the work function metal layer. The main electrode is located on the (work function) metal oxide layer. Moreover a semiconductor process forming said semiconductor structure is also provided. |
申请公布号 |
US8836049(B2) |
申请公布日期 |
2014.09.16 |
申请号 |
US201213495009 |
申请日期 |
2012.06.13 |
申请人 |
United Microelectronics Corp. |
发明人 |
Tsai Min-Chuan;Huang Hsin-Fu;Hsu Chi-Mao;Lin Chin-Fu;Chen Chien-Hao;Chen Wei-Yu;Sun Chi-Yuan;Hsieh Ya-Hsueh;Cheng Tsun-Min |
分类号 |
H01L29/94;H01L29/76 |
主分类号 |
H01L29/94 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A semiconductor structure, comprising:
a work function metal layer located on a substrate, the work function metal layer comprising titanium aluminide, regardless of whether the semiconductor structure is a PMOS transistor or a NMOS transistor; a work function metal oxide layer located on the work function metal layer; a main electrode located on the work function metal oxide layer; and a barrier-wetting layer located between the work function metal oxide layer and the main electrode, so that the work function metal layer, the work function metal oxide layer, the barrier-wetting layer and the main electrode constitute a metal gate. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |