发明名称 Semiconductor structure and process thereof
摘要 A semiconductor structure includes a work function metal layer, a (work function) metal oxide layer and a main electrode. The work function metal layer is located on a substrate. The (work function) metal oxide layer is located on the work function metal layer. The main electrode is located on the (work function) metal oxide layer. Moreover a semiconductor process forming said semiconductor structure is also provided.
申请公布号 US8836049(B2) 申请公布日期 2014.09.16
申请号 US201213495009 申请日期 2012.06.13
申请人 United Microelectronics Corp. 发明人 Tsai Min-Chuan;Huang Hsin-Fu;Hsu Chi-Mao;Lin Chin-Fu;Chen Chien-Hao;Chen Wei-Yu;Sun Chi-Yuan;Hsieh Ya-Hsueh;Cheng Tsun-Min
分类号 H01L29/94;H01L29/76 主分类号 H01L29/94
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A semiconductor structure, comprising: a work function metal layer located on a substrate, the work function metal layer comprising titanium aluminide, regardless of whether the semiconductor structure is a PMOS transistor or a NMOS transistor; a work function metal oxide layer located on the work function metal layer; a main electrode located on the work function metal oxide layer; and a barrier-wetting layer located between the work function metal oxide layer and the main electrode, so that the work function metal layer, the work function metal oxide layer, the barrier-wetting layer and the main electrode constitute a metal gate.
地址 Science-Based Industrial Park, Hsin-Chu TW