发明名称 Voltage test devices used in LCD panels and a system thereof
摘要 A voltage test device used in liquid crystal display (LCD) panels, including test solder pads and test lines, is proposed. The test solder pads are connected to an LCD panel through the test lines. Each of the test lines includes a switch test line and a signal-inputting test line. The voltage test device further includes a first connector. The switch test line includes a first portion of the switch test line and a second portion of the switch test line. The first portion of the switch test line is connected to the second portion of the switch test line through the first connector. The first connector is used for preventing the electric current in excess of a predetermined threshold from flowing inside the LCD panel. Meanwhile, a voltage testing system used in LCD panels is proposed.
申请公布号 US8836364(B2) 申请公布日期 2014.09.16
申请号 US201113318349 申请日期 2011.08.12
申请人 Shenzhen China Star Optoelectronics Technology Co., Ltd 发明人 Wang Jin-jie
分类号 G01R31/26;G09G3/00;G01R1/36;G01R31/28 主分类号 G01R31/26
代理机构 代理人
主权项 1. A voltage test device for testing an LCD panel, comprising test solder pads connected to an LCD panel through the test lines, and test lines comprising a switch test line and a signal-inputting test line, characterized in that: the voltage test device further comprises a first connector, the switch test line comprises a first portion and a second portion, and the first portion of the switch test line is connected to the second portion of the switch test line through the first connector; the first connector is used for preventing the electric current in excess of a predetermined threshold from flowing inside the LCD panel; a third connector and a first transistor is disposed on the switch test line; a second transistor is disposed on the signal-inputting test line, and the voltage test device further comprises a fourth connector; wherein a source of the first transistor is connected to the test solder pad corresponding to the switch test line through the third connector, and a drain of the first transistor is connected to a gate of the second transistor through the fourth connector; a source of the second transistor is connected to the test solder pad corresponding to the signal-inputting test line, and a drain of the second transistor is connected to a source of a switch inside the LCD panel.
地址 Guangdong CN