| 摘要 |
<p>The present invention relates to a probe member for a pogo pin and, more specifically, to the probe member for a pogo pin which is used for a test of a semiconductor device. At least a part of the probe member for a pogo pin is inserted into a tube shaped body and is supported by an elastic member. The upper end of the probe member for the pogo pin is in contact with a terminal of the semiconductor device. The probe member for a pogo pin comprises; a probe unit having a plurality of probes which is in contact with the semiconductor device; and a coupling unit which is extended from the probe unit to the lower side and is inserted into the tube shaped body to be coupled with the tube shaped body. The probe comprises; a first probe which is in contact with the terminal of the semiconductor device and is arranged at the center; a second probe which is arranged to be close to the first probe and has a guiding side to guide the terminal of the semiconductor device towards the first probe.</p> |
