Power/performance optimization through continuously variable temperature-based voltage control

摘要

Methods determine temperature and voltage relationships for integrated circuit library elements to produce a continuous temperature-voltage function. Some of the library elements can be used or combined to form an integrated circuit design. Further, the performance characteristics for integrated circuit chips produced according to the integrated circuit design can be defined, such performance characteristics include an operating temperature range, etc. The continuous temperature-voltage function is applied to the performance characteristics to determine a plurality of temperature/voltage combinations for the integrated circuit chips. Each of the temperature/voltage combinations comprises an operating voltage for each operating temperature within the operating temperature range of the integrated circuit chips. Next, the integrated circuit chips are produced according to the integrated circuit design. The temperature/voltage combinations are recorded in memory of the integrated circuit chips.

主权项

1. A method comprising:
determining temperature and voltage relationships for integrated circuit library elements to create a continuous temperature-voltage function, using a computerized device; combining ones of said library elements to form an integrated circuit design, using said computerized device; identifying performance characteristics for integrated circuit chips produced according to said integrated circuit design, said performance characteristics including an operating temperature range; applying said continuous temperature-voltage function to said performance characteristics to determine a plurality of temperature/voltage combinations, each of said temperature/voltage combinations comprising an operating voltage for each operating temperature within said operating temperature range; producing said integrated circuit chips using manufacturing equipment operatively connected to said computerized device; and recording in memory of said integrated circuit chips said temperature/voltage combinations, further comprising: calculating, for each of said temperature/voltage combinations, a power consumption amount using said computerized device; determining an amount of time each of said integrated circuit chip will be operating at each different operating voltage, using said computerized device; and calculating an average system power, using said computerized device, based on:
said amount of time each of said integrated circuit chip will be operating at each said different operating voltage; andsaid power consumption amount at each said different operating voltage.