发明名称 SEMICONDUCTOR DEVICE HAVING DUAL METAL SILICIDE LAYER AND METHOD OF MANUFACTURING THE SAME
摘要 <p>Provided is a semiconductor device having a dual metal silicide layer. The semiconductor having the dual metal silicide layer includes a first epitaxial layer which is provided on both sides of a first metal gate electrode on a substrate; a second epitaxial layer which is provided on both sides of a second metal gate electrode on the substrate and includes a different element from that of the first epitaxial layers; a first metal silicide layer on the first epitaxial layer; a second silicide layer which is formed on the second epitaxial layer and includes different metal from that of the first metal silicide layer; an interlayer insulating film on the first and second metal silicide layers and first and second gate electrodes; and a contact plug which passes through the interlayer insulating film and is disposed within first and second contact plugs exposing the first metal silicide layer and the second metal silicide layer, respectively.</p>
申请公布号 KR20140108960(A) 申请公布日期 2014.09.15
申请号 KR20130022931 申请日期 2013.03.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SANG JINE;YOON, BO UN;HAN, JEONG NAM;KWON, KEE SANG;CHO, BYUNG KWON;CHOI, WON SANG
分类号 H01L21/8238;H01L21/336;H01L29/78 主分类号 H01L21/8238
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