发明名称 POWER MOS TRANSISTOR WITH IMPROVED METAL CONTACT
摘要 <p>A power MOS field effect transistor (FET) has a plurality of transistor cells, each cell having a source region and a drain region to be contacted through a surface of a silicon wafer die. A first dielectric layer is disposed on the surface of the silicon wafer die and a plurality of grooves are formed in the first dielectric layer above the source regions and drain regions, respectively and filled with a conductive material. A second dielectric layer is disposed on a surface of the first dielectric layer and has openings to expose contact areas to said grooves. A metal layer is disposed on a surface of the second dielectric layer and filling the openings, wherein the metal layer is patterned and etched to form separate metal wires connecting each drain region and each source region of the plurality of transistor cells, respectively through the grooves.</p>
申请公布号 WO2014137644(A1) 申请公布日期 2014.09.12
申请号 WO2014US18034 申请日期 2014.02.24
申请人 MICROCHIP TECHNOLOGY INCORPORATED 发明人 DIX, GREGORY;KLINE, HAROLD;GRIMM, DAN;MELCHER, ROGER;WILLIAMS, JACOB, L.
分类号 H01L23/522;H01L29/78 主分类号 H01L23/522
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