发明名称 TEST METHOD AND SYSTEM
摘要 <p>Disclosed are a test method and system. The method comprises: M test devices are connected to the input terminal of a test channel selecting device, and N devices to be tested are connected to the output terminal of the test channel selecting device, wherein M is greater than or equal to 1, and N is greater than or equal to 1; and the test channel selecting device can select, according to a test channel control instruction, the corresponding test device from the M test devices to test the N devices to be tested. Under the control of a test channel control command, the test channel selecting device in the present invention can automatically select one or more test devices to test the N devices to be tested. During the process of a test, there is no need to manually switch the device to be tested which is connected to the test device. Automatically switch is performed according to the control command by the test channel selecting device, and one or more tests can be performed to the N devices to be tested which are connected to the test channel selecting device. Thus the testing efficiency of the test device can be increased and the test cost can be reduced in the present invention.</p>
申请公布号 WO2014134984(A1) 申请公布日期 2014.09.12
申请号 WO2014CN71113 申请日期 2014.01.22
申请人 ZTE CORPORATION 发明人 CHEN, YUHUA;LIU, XINZHENG;CAI, CHENGLIANG
分类号 H04B17/00 主分类号 H04B17/00
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