| 发明名称 |
ANALYSIS DEVICE, ANALYSIS METHOD, OPTICAL ELEMENT AND ELECTRONIC APPARATUS FOR ANALYSIS DEVICE AND ANALYSIS METHOD, AND METHOD OF DESIGNING OPTICAL ELEMENT |
| 摘要 |
An analysis device includes an optical element which includes a metal layer, a light transmitting layer provided on the metal layer to transmit light, and a plurality of metal particles arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction on the light transmitting layer, P1<P2, a light source which irradiates incident light incident on the optical element, and a detector which detects light emitted from the optical element. Linearly polarized light in the same direction as the first direction and linearly polarized light in the same direction as the second direction are irradiated onto the optical element. |
| 申请公布号 |
US2014255913(A1) |
申请公布日期 |
2014.09.11 |
| 申请号 |
US201414196551 |
申请日期 |
2014.03.04 |
| 申请人 |
Seiko Epson Corporation |
发明人 |
Sugimoto Mamoru;Mano Tetsuo;Enari Megumi |
| 分类号 |
G01N21/65;G02B5/00 |
主分类号 |
G01N21/65 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An analysis device comprising:
an optical element which includes a metal layer, a light transmitting layer provided on the metal layer to transmit light, and a plurality of metal particles on the light transmitting layer, the metal particles being arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction; a light source which irradiates incident light incident on the optical element; and a detector which detects light emitted from the optical element, wherein P1<P2, and polarized light is irradiated onto the optical element. |
| 地址 |
Tokyo JP |
