发明名称 |
RAMAN SCATTERING MEASURING APPARATUS AND RAMAN SCATTERING MEASURING METHOD |
摘要 |
The Raman scattering measuring apparatus includes a first light generator to produce a first light, a second light generator to produce a second light having a frequency different from that of the first light, an optical system to focus the first and second lights to a sample, and a detector to detect the first or second light intensity-modulated by Raman scattering. The first light generator includes a wavelength extractor that performs a wavelength filtering to extract light of an extraction wavelength from light in a wavelength range including the extraction wavelength and an amplification of the light extracted by the wavelength filtering. The wavelength extractor performs a first filtering on an entering light, a first amplification on the light extracted by the first filtering, a second filtering on the light amplified by the first amplification and a second amplification on the light extracted by the second filtering. |
申请公布号 |
US2014253918(A1) |
申请公布日期 |
2014.09.11 |
申请号 |
US201414198979 |
申请日期 |
2014.03.06 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
OZEKI Yasuyuki;ITOH Kazuyoshi;NOSE Keisuke |
分类号 |
G01J3/44 |
主分类号 |
G01J3/44 |
代理机构 |
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代理人 |
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主权项 |
1. A Raman scattering measuring apparatus comprising:
a first light generator configured to produce a first light; a second light generator configured to produce a second light having a wavelength different from that of the first light; an optical system configured to focus the first and second lights to a sample; and a detector configured to detect the first or second light intensity-modulated by Raman scattering caused by the focusing of the first and second lights to the sample, wherein the first light generator includes a wavelength extractor configured to perform (a) a wavelength filtering to extract light of an extraction wavelength from light in a wavelength range including the extraction wavelength and (b) an amplification of the light extracted by the wavelength filtering, and wherein the wavelength extractor is configured to perform: a first filtering as the wavelength filtering on an entering light; a first amplification as the amplification on the light extracted by the first filtering; a second filtering as the wavelength filtering on the light amplified by the first amplification; and a second amplification as the amplification on the light extracted by the second filtering. |
地址 |
Tokyo JP |