发明名称 SPECTROMETER
摘要 A spectrometer includes: a wavelength-variable interference filter that can change a wavelength of selected light and disperses light from a measurement target; an imaging unit that receives light components with a plurality of wavelengths which are dispersed by the wavelength-variable interference filter and acquires a plurality of spectral images; a positional deviation amount detection unit that selects a standard image from the plurality of spectral images acquired by the imaging unit and detects a positional deviation amount of a pixel position which receives light from a predetermined position of the measurement target between the standard image and at least one of the spectral images other than the standard image; and a position correction unit that positions the spectral images other than the standard image on the basis of the detected positional deviation amount.
申请公布号 US2014253924(A1) 申请公布日期 2014.09.11
申请号 US201414196529 申请日期 2014.03.04
申请人 Seiko Epson Corporation 发明人 Sano Akira
分类号 G01J3/28 主分类号 G01J3/28
代理机构 代理人
主权项 1. A spectrometer comprising: a spectral element that can change a wavelength of selected light and disperses light from an object; an imaging unit that receives light components with a plurality of wavelengths which are dispersed by the spectral element and acquires a plurality of spectral images; a positional deviation amount detection unit that selects a standard image from the plurality of spectral images acquired by the imaging unit and detects a positional deviation amount of a pixel position which receives light from a predetermined position of the object between the standard image and at least one of the spectral images other than the standard image; and a positioning unit that positions the spectral images other than the standard image on the basis of the positional deviation amount detected by the positional deviation amount detection unit.
地址 Tokyo JP