发明名称 Magnetic Random Access Memory Cells with Isolating Liners
摘要 A manufacturing method to form a memory device includes forming a hard mask on a magnetic stack. A first magnetic stack etch is performed to form exposed magnetic layers. A liner is applied to the exposed magnetic layers to form protected magnetic layers. A second magnetic stack etch forms a magnetic random access memory (MRAM) cell, where the liner prevents shunting between the protected magnetic layers.
申请公布号 US2014252516(A1) 申请公布日期 2014.09.11
申请号 US201414203362 申请日期 2014.03.10
申请人 Crocus Technology Inc. 发明人 Beery Dafna;Reid Jason;Shin Jong;Nozieres Jean Pierre;Joubert Olivier
分类号 H01L43/02;H01L43/12 主分类号 H01L43/02
代理机构 代理人
主权项 1. A manufacturing method to form a memory device, comprising: forming a hard mask on a magnetic stack; performing a first magnetic stack etch to form exposed magnetic layers; applying a liner to the exposed magnetic layers to form protected magnetic layers; and performing a second magnetic stack etch to form a magnetic random access memory (MRAM) cell, wherein the liner prevents shunting between the protected magnetic layers.
地址 Santa Clara CA US