HIGH ACCURACY ELECTRICAL TEST INTERCONNECTION DEVICE AND METHOD FOR ELECTRICAL CIRCUIT BOARD TESTING

摘要

A high accuracy electrical test interconnect method employs a tester interface transfer block to enable the transfer of electrical contact from less accurate tester resource probes to target probes which are contained in the tester interface transfer block and can be positioned with high accuracy using the three dimensional printing to enable reliable contact with smaller test pads. The target probes can directly contact the tester resource probes or a transfer plate can be interposed between the target probes and the tester resource probes to allow positional adjustment of the target probes relative to the tester resource probes. This invention also includes the use of specialized shape target probes that can contact circuit board objects, such as vertical conductive surfaces and irregular shape test pads that have not been accessible with traditional methods.

主权项

1. A method to transfer electrical contact from tester resource contacts to target probes, comprising:
a. providing a tester interface transfer block, said tester interface transfer block comprising guide tubes for the target probes and access tubes for the tester resource contacts; and b. transferring electrical contact from said tester resource contacts to said target probes via said tester interface transfer block.