发明名称 Photo-Resist with Floating Acid
摘要 A method for fabricating a semiconductor product includes applying a photo-resist layer to a substrate, the photo-resist layer including a higher acid concentration at an upper portion of the photo-resist layer than at a lower portion of the photo-resist layer. The method also includes exposing the photo-resist layer to a light source through a mask including a feature, the photo-resist layer including a floating, diffusing acid that will diffuse into a region of the photo-resist layer affected by the feature while not diffusing into a feature formed by the mask.
申请公布号 US2014255850(A1) 申请公布日期 2014.09.11
申请号 US201313791992 申请日期 2013.03.09
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Chang Ching-Yu;Shieh Ming-Feng;Tseng Wen-Hung
分类号 G03F7/004 主分类号 G03F7/004
代理机构 代理人
主权项 1. A method for fabricating a semiconductor product, the method comprising: applying a positive tone photo-resist layer to a substrate; exposing the photo-resist layer to a light source through a mask including a feature; and using a negative tone developer to develop away regions of the photo-resist layer that are without acid; wherein the photo-resist layer includes floating acid components including one or more of floating Photo Acid Generator (PAG) components, Thermal Acid Generator (TAG) components, or an organic acid.
地址 Hsin-Chu TW