发明名称 |
Photo-Resist with Floating Acid |
摘要 |
A method for fabricating a semiconductor product includes applying a photo-resist layer to a substrate, the photo-resist layer including a higher acid concentration at an upper portion of the photo-resist layer than at a lower portion of the photo-resist layer. The method also includes exposing the photo-resist layer to a light source through a mask including a feature, the photo-resist layer including a floating, diffusing acid that will diffuse into a region of the photo-resist layer affected by the feature while not diffusing into a feature formed by the mask. |
申请公布号 |
US2014255850(A1) |
申请公布日期 |
2014.09.11 |
申请号 |
US201313791992 |
申请日期 |
2013.03.09 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
Chang Ching-Yu;Shieh Ming-Feng;Tseng Wen-Hung |
分类号 |
G03F7/004 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a semiconductor product, the method comprising:
applying a positive tone photo-resist layer to a substrate; exposing the photo-resist layer to a light source through a mask including a feature; and using a negative tone developer to develop away regions of the photo-resist layer that are without acid; wherein the photo-resist layer includes floating acid components including one or more of floating Photo Acid Generator (PAG) components, Thermal Acid Generator (TAG) components, or an organic acid. |
地址 |
Hsin-Chu TW |