发明名称 APPARATUS AND METHODS FOR FABRICATING A PHOTOMASK SUBSTRATE FOR EUV APPLICATIONS
摘要 An apparatus and methods utilized a DC or AC power to supply through a conductive substrate support pedestal to a conductive photomask substrate during a photomask substrate manufacturing process for EUV or other advanced lithography applications are provided. In one embodiment, an apparatus for processing a photomask includes a substrate support pedestal configured to receive a conductive photomask, wherein the conductive photomask is fabricated from a dielectric material substrate with a conductive coating, and at least a conductive path formed in the substrate support pedestal in contact with the photomask substrate configured to be conductive.
申请公布号 US2014255830(A1) 申请公布日期 2014.09.11
申请号 US201414199575 申请日期 2014.03.06
申请人 Applied Materials, Inc. 发明人 WU Banqiu;KUMAR Ajay
分类号 G03F1/80 主分类号 G03F1/80
代理机构 代理人
主权项 1. A method for etching a photomask for lithographic applications, comprising: providing a conductive photomask on a substrate support pedestal disposed in a plasma processing chamber, wherein the conductive photomask is fabricated from a dielectric material substrate with a conductive coating; supplying a gas mixture into the processing chamber; and applying a DC or AC power through a conductive path formed in the substrate support pedestal to the conductive photomask during etching, wherein the substrate conductive path in the substrate support pedestal allows DC or AC power to pass therethrough to the conductive photomask.
地址 Santa Clara CA US