发明名称 |
SEMICONDUCTOR FIN FORMATION METHOD AND MASK SET |
摘要 |
A mask set and method for forming FinFET semiconductor devices provides a complementary set of fin-cut masks that are used in DPT (double patterning technology) to remove fins from non-active areas of a semiconductor device, after the fins are formed. Adjacent fins, or adjacent groups of fins, are removed using pattern features from different ones of the multiple fin-cut masks. |
申请公布号 |
US2014256144(A1) |
申请公布日期 |
2014.09.11 |
申请号 |
US201313792923 |
申请日期 |
2013.03.11 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LO Tzu-Chun;CHENG Min-Hung;SU Hsiao-Wei;HO Jeng-Shiun;TSAI Ching-Che;KUO Cheng-Cheng;LIN Hua-Tai;LIU Chia-Chu;CHEN Kuei-Shun |
分类号 |
H01L21/461 |
主分类号 |
H01L21/461 |
代理机构 |
|
代理人 |
|
主权项 |
1. A mask set for forming a fin pattern in active areas on a semiconductor device, said mask set comprising:
a fin mask with a pattern defining a plurality of parallel fins; a first fin-cut mask with a plurality of parallel first fin-cut regions outside of active areas of said semiconductor device, each said first fin-cut region including at least one strip that corresponds to at least a portion of a fin of said plurality of parallel fins; and a second fin-cut mask with a plurality of parallel second fin-cut regions outside of said active areas, each said second fin-cut region including at least one strip that corresponds to at least a portion of a fin of said plurality of parallel fins, wherein said first and second fin-cut regions are parallel and appear in an alternating sequence with respect to said plurality of parallel fins, when said first and second fin-cut masks are overlaid. |
地址 |
Hsin-Chu TW |