发明名称 Test System Having Test Stations With Adjustable Antennas
摘要 A test system may include a master test station and slave test stations. The test stations may receive devices under test such as portable wireless electronic devices. Each test station may have adjustable antenna structures coupled to test equipment. The adjustable antenna structures may include antenna support structures on which test antennas are mounted and rail along which the antenna support structures and test antennas are moved by a pneumatic positioner. A rotatable platform may be provided in each test station to support the device under test in that test station. By making a series of over-the-air test measurements in the master test station while adjusting the antenna system and device positioning system, a satisfactory location for the active test antenna and device position may be identified. This configuration may then be used in performing single-point over-the-air tests in the slave test stations.
申请公布号 US2014256373(A1) 申请公布日期 2014.09.11
申请号 US201313787515 申请日期 2013.03.06
申请人 APPLE, INC. 发明人 Hernandez Diego C.;Sen Indranil;Chen Chun-Lung;Gomez Tagle Javier
分类号 H04B17/00 主分类号 H04B17/00
代理机构 代理人
主权项 1. A method of testing wireless electronic devices under test, comprising: in a master test station in which a device under test is located, adjusting an adjustable antenna system to identify a satisfactory position for an antenna in the adjustable antenna system for making test measurements on the device under test; and adjusting an adjustable antenna system in each of a plurality of slave test stations to place antennas in the adjustable antenna systems of the slave test stations in the satisfactory position; and while the antennas in the adjustable antenna systems of the slave test stations are in the satisfactory position, wirelessly testing respective devices under test in the slave test stations using the antennas in the adjustable antenna systems of the slave test stations.
地址 Cupertino CA US